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The Growth and Assessment of GaAs Epitaxial Layers Obtained From Ga-As-Bi Solutions
GaAs Epitaxial Layers Ga-As-Bi Solutions
2010/12/21
X-Ray investigations of GaAs epitaxial layers obtained from Ga-As-Bi solutions with different amounts of bismuth are presented. An equilibrium cooling and two phase technique for the deposition of the...
Reliability Assessment and Screening by Reliability Indicator Methods
Reliability Indicator Methods Built-in flaws electronic components
2010/12/23
Built-in flaws in electronic components have been recognized as a serious cause of failure. They are difficult to screen away by conventional methods because the times-to-failures for component workin...