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A stochastic model for interconnections in integrated circuits composed of unequal size logic blocks separated by routing channels is described. An algorithm, based on the model, is given for estimati...
Accurate modeling of high speed RLC interconnects has become a necessity to address signal integrity issues in current VLSI design. To accurately model a dispersive system of interconnects at highe...
In order to characterise the velocity saturation phenomena in short channel MOSFET's, a simple method is proposed in this work. It is based on the comparison between transistor behaviour in ohmic and ...
A new method for extracting junction parameters of the single diode model is presented. A least squares method approach considers the deviation ∆V=f(I) between the experimental current-voltage (...
A theoretical model based on standard molecular-orbital theory and extended Hückel approach is proposed. This model is valid for amorphous group IV semiconductors and represents a substantial improvem...
Tetrahedraily bonded amorphous semiconductors exhibit a structure suitable for applying the so-called extended Hückel theory (EHT) to determine the electronic density of states by means of the cluster...
This paper consists of a new formalism in order to interpret the electron-hole recombination rate in semiconductors by means of linear algebraic methods; a formulation based on tensorial concepts intr...

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