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恩智浦半导体（天津）有限公司招聘！职位：测试工程师（Test Engineer)。
FAULT DIAGNOSIS OF ELECTRONIC FUEL CONTROL (EFC) VALVES VIA DYNAMIC PERFORMANCE TEST METHOD
System Modeling System Identification Fuzzy Logic Fault Diagnosis Electronic Fuel Control Valve EFC
2015/1/20
Electronic Fuel Control (EFC) valve regulates fuel flow to the injector fuel supply line in the Cummins Pressure Time (PT) fuel system. The EFC system controls the fuel flow by means of a variable ori...
VIRTEX 4 LX200 automated temperature stress test serial interface and test control logic design implementation
Automatic test hot chamber temperature pressure equipment temperature
2014/12/31
The overall project is to create a system that automatically tests the internal components of Xilinx Virtex 4 LX200 device, while the device is running in a thermal chamber at temperatures that stress...
Aircraft ground station communications test environment characterization
Aircraft communications ground test ground to air communications the transmission path
2014/12/31
This project report presents the concept, rationale, and results for the environment characterization pertaining to an aircraft communications ground test. The overall objective of this effort was to ...
Rao statistical test for radar targets based on SG-Alpha stable distribution
radar target detection Rao test subGaussian-Alpha stable distribution non-Gaussian clutter
2012/3/22
In relative non-Gaussian clutter backgrounds, one of the difficulties on radar target detection is to establish a likelihood ratio test model. Based on the SG-Alpha（subGaussian-Alpha）stable distributi...
An extended component-based reliability model for protective systems to determine routine test schedule
Reliability protective system routine test redundancy
2011/3/23
This paper presents a novel approach for evaluating the reliability of protective systems taking into account its components reliability. In this paper, a previously proposed extended model is used fo...
Managing Lithographic Variations in Design, Reliability, and Test Using Statistical Techniques
Control Structures Design for Manufacturability Electromigration Manufacturing Yield Photolithography Reliability
2014/11/7
Much of today's high performance computing engines and hand-held mobile devices are products of aggressive CMOS scaling. Technology scaling in semiconductor industry is mainly driven by corresponding ...
New ESD standard and influence on test equipment requirements
New ESD standard test equipment requirements
2010/1/11
The IEC61000-4 series of standards form a basic framework for the immunity and emissions testing of electrical and electronic equipment. They are the basis for EN standards used to test CE compliance ...
A New Stability Test for Passivated NiCr Thin Film Resistors
passivated NiCr thin film resistors Arrhenius type
2010/12/16
A suitable short-time test for analysis of long term stability is presented for the case of passivated NiCr thin film resistors revealing an aging characteristic which is not of Arrhenius type. Based ...
Usage of Sims and Auger Test Methods in the Production of Multilayer Printed Circuit Boards
Sims and Auger Test Methods Multilayer Printed Circuit Boards
2010/12/23
The quality and reliability of multilayer boards are determined by the adhesion strength between the copper sheets and the epoxy-glass laminates. The adhesion properties of copper foil may be improved...
Process and Accelerated Aging Test of GANG Bonding for Gold-Plated TAB Outer Leads
GANG Bonding Gold-Plated TAB Outer Leads
2011/1/5
This paper presents the evaluation results of thermocompression GANG Bonding of gold-plated TAB outer leads to three kinds of metallized ceramic substrates. Gold-Selective Plating (GSP) substrates for...