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Optical and electrical characterization of reverse bias luminescence in InGaN light emitting diodes
GaN LED electroluminescence reverse-bias leakage current hot carrier
2011/5/5
This study investigates the reliability physics of the reverse bias luminescence (RBL) of
InGaN/GaN light emitting diodes. Optical and electrical characterization techniques including
surface temper...
Optical and electrical characterization of defects in zinc oxide thin films grown by atomic layer deposition
zinc oxide atomic layer deposition (ALD)
2011/5/11
In the present paper, we discuss the influence of point defects on electrical and optical characteristics of ZnO thin films grown by the atomic layer deposition (ALD) method. The films were grown on g...