搜索结果: 1-15 共查到“材料科学 microscopy”相关记录15条 . 查询时间(0.033 秒)
Overcoming the limitations of scanning electron microscopy with AI
efficient super resolution imaging SEM AI
2021/8/10
A team develops a highly efficient super-resolution imaging based on deep learning.
Subatomic microscopy key to building new classes of materials
Subatomic microscopy new classes of materials
2016/9/12
Researchers at Penn State and the Molecular Foundry at Lawrence Berkeley National Laboratory are pushing the limits of electron microscopy into the tens of picometer scale, a fraction of the size of a...
Advanced and Analytical Microscopy and Spectroscopy of Nanostructures and Engineering Materials
optics communications
2016/7/25
The symposium aims at providing a forum for researchers interested in applying advanced methods of electron microscopy and spectroscopy, including aberration-corrected electron microscopy, and in-situ...
The 16th European Microscopy Congress
Life Sciences Instrumentation and Methods Materials Science
2016/7/22
Day after day, we are getting closer to the XVIth EMC meeting in Lyon.
For the organizing team, including the local and scientific committees, our PCO partner, volunteers from Lyon, Grenoble and St-...
Symposium TC4: Advances in Spatial, Energy and Time Resolution in Electron Microscopy
Materials dynamics nanoparticles
2016/7/21
The last few years have seen dramatic advances in electron microscope resolution, spatial resolution through aberration correction, energy resolution through monochromation, and time resolution throug...
CLAIRE Brings Electron Microscopy to Soft Materials（图）
CLAIRE Electron Microscopy Soft Materials
2015/5/25
Soft matter encompasses a broad swath of materials, including liquids, polymers, gels, foam and – most importantly – biomolecules. At the heart of soft materials, governing their overall properties an...
Mid-IR-laser microscopy as a tool for defect investigation in bulk semiconductors
Mid-IR-laser microscopy defect investigation bulk semiconductors
2011/9/9
A non-destructive optical technique described in this paper is an effective new tool for the investigation of defects in semiconductors. The basic instrument for this technique—a mid-IR-laser microsco...
Optical beam-induced scattering mode of mid-IR laser microscopy: a method for defect investigation in near-surface and near-interface regions of bulk semiconductors
Optical beam-induced scattering mode mid-IR laser microscopy
2011/9/9
This paper presents a new technique of optical beam-induced scattering of mid-IR-laser radiation, which is a special mode of the recently developed scanning
mid-IR-laser microscopy. The technique in ...
Low-energy cathodoluminescence microscopy for the characterization of nanostructures
Low-energy cathodoluminescence microscopy the characterization nanostructures
2010/10/12
Spatially and spectrally resolved low-energy cathodoluminescence (CL) microscopy was applied to the characterization of nanostructures. CL has the advantage of revealing not only the presence of lumin...
Water distribution at solid/liquid interfaces visualized by frequency modulation atomic force microscopy
Water distribution solid/liquid interfaces visualized frequency modulation atomic force microscopy
2010/10/12
Interfacial phenomena at solid/water interfaces play an important role in a wide range of industrial technologies and biological processes. However, it has been a great challenge to directly probe the...
Electron microscopy investigation of the Cr–Mo–V cast steel
Metallic alloys Electron microscopy Microstructure
2009/12/2
Purpose: Investigation of low alloy Cr–Mo–V cast steel after long – term operation and regenerative heat treatment.
Design/methodology/approach: Micro structural investigations were carried out using...
Investigation of Deformation at the Grain Scale in Polycrystalline Materials by Coupling Digital Image Correlation and Digital Microscopy
Polycrystalline Materials Digital Image Correlation Digital Microscopy
2015/3/30
The purpose of this paper is to present an approach for the investigation of in-plane strain distribution at the grain scale in polycrystalline materials. The technique is developed by coupling digita...
Application of dynamic impedance spectroscopy to atomic force microscopy
atomic force microscopy dynamic electrochemical impedance spectroscopy non-stationarity
2010/10/12
Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials.It is useful to combine those...
Nanofabrication by advanced electron microscopy using intense and focused beam
electron-beam-induced deposition iron carbonyl nanorod electron holography ultrahigh vacuum Cs corrector scanning transmission electron microscopy
2010/10/13
The nanogrowth and nanofabrication of solid substances using an intense and focused electron
beam are reviewed in terms of the application of scanning and transmission electron
microscopy (SEM, TEM ...
Active nanocharacterization of nanofunctional materials by scanning tunneling microscopy
nanotechnology nanocharacterization scanning tunneling microscopy scanning probe microscopy nanomaterials nanofabrication
2010/10/13
Recent developments in the application of scanning tunneling microscopy (STM) to
nanofabrication and nanocharacterization are reviewed. The main focus of this paper is to
outline techniques for depo...