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Investigation on a solution to improve the irradiation reliability of SOI NMOSFET
SOI irradiation total dose effect NMOSFET
2009/8/14
A solution is developed to improve the irradiation reliability of SOI NMOSFET (N-type Metal Oxide Semiconductor Field Effect Transistor). This solution, including SOI (Silicon On Insulator) wafer har...
Exact Analytical Solution of the Diode Ideality Factor of a pn Junction Device Using Lambert W-function Model
Ideality factor Lambert W-function Solar cell
2010/4/9
The paper presents a new analytical method for extracting the diode ideality factor of a p-n junction device using Lambert W-function model and the dark current-voltage data. The extracted values are ...