搜索结果: 1-15 共查到“信息处理技术 CMOS”相关记录30条 . 查询时间(0.093 秒)
中国科学院半导体研究所超晶格国家重点实验室高速图像传感及信息处理课题组副研究员刘力源等研制出面向860GHz CMOS太赫兹图像传感器的像素器件。相关研究成果将于2017年在太赫兹领域学术期刊IEEE Transaction on Terahertz Science and Technology 上发表。太赫兹 (Terahertz, THz) 波是指频率在0.3 THz - 3 THz 范围内，...
研究了电子辐射剂量对CMOS图像传感器性能的影响,性能参数为平均暗电流输出和光强响应度。搭建了电子辐射场和光强响应度的测量系统,在器件处于工作状态和非工作状态下分别对其辐射,辐射剂量为:5×103 rad、1×104 rad、7×104 rad、1×105 rad、5×105 rad。对于暗电流,当辐射总剂量超过7×104 rad~1×105 rad之间的某一个阈值时,暗电流随着辐射剂量的增长基本...
A 0.5p,m Pixel Frame-Transfer CCD Image Sensor in 110nm CMOS
A 0.5p,m Pixel Frame-Transfer CCD Image Sensor CMOS
2015/8/17
A 0.5p,m Pixel Frame-Transfer CCD Image Sensor in 110nm CMOS.
Photocurrent Estimation for a Self-Reset CMOS Image Sensor
CMOS image sensor self-reset SNR dynamic range estimation
2015/8/17
CMOS image sensors are capable of very high frame rate non-destructive readout. This capability and the potential of integrating memory and signal processing with the sensor on the same chip enable th...
Photocurrent Estimation from Multiple Non-destructive Samples in a CMOS Image Sensor
Photocurrent Estimation Multiple Non-destructive Samples CMOS Image Sensor
2015/8/17
CMOS image sensors generally su er from lower dynamic range than CCDs due to their higher readout noise.Their high speed readout capability and the potential of integrating memory and signal processin...
Active Pixel Sensors Fabricated in a Standard 0.18 urn CMOS Technology
CMOS APS image sensor dark current quantum efficiency photodiode photogate
2015/8/17
CMOS image sensors have benefited from technology scaling down to O.351um with only minor process modifications. Several studies have predicted that below O.25m, it will become difficult, if not impos...
Analysis of 1/f noise in CMOS APS
bthreshold operation nonstationary 1/f noise model time domain noise analysis CMOS APS image sensor
2015/8/17
As CMOS technology scales, the effect of 1/f noise on low frequency analog circuits such as CMOS image sensors becomes more pronounced, and therefore must be more accurately estimated. Analysis of 1/f...
Multiple Capture Single Image Architecture with a CMOS Sensor
Multiple Capture Single Image Architecture CMOS Sensor
2015/8/17
We describe a programmable digital camera sensor with pixel-level analog-to-digital conversion (ADC). The sensor, which was designed and implemented by our group, is programmable in the sense that the...
Analysis of Temporal Noise in CMOS APS
emporal noise subthreshold operation reset noise shot noise CMOS APS image sensor
2015/8/17
Temporal noise sets a fundamental limit on image sensor performance, especially under low illumination and in video applications. In a CCD image sensor, temporal noise is well studied and characterize...
Characterization of CMOS Image Sensors with Nyquist Rate Pixel Level ADC
ixel level ADC dark current fixed pattern noise read noise QE
2015/8/17
Techniques for characterizing CCD imagers have been developed over many years. These techniques have been recently modified and extended to CMOS PPS and APS imagers. With the scaling of CMOS technolog...
A Nyquist Rate Pixel Level ADC for CMOS Image Sensors
Nyquist Rate Pixel Level ADC CMOS Image Sensors
2015/8/17
A Nyquist rate Multi-Channel Bit Serial (MCBS) ADC using successive comparisons is presented. The ADC is suited to pixel level implementation in a CMOS image sensor. It comprises a 1-bit comparator/la...
A Method for Estimating Quantum Efficiency for CMOS Image Sensors
Quantum efficiency CMOS image sensors gain FPN
2015/8/17
The standard method for measuring QE for a CCD sensor is not adequate for CMOS APS since it does not take into consideration the random offset, gain variations, and nonlinearity introduced by the APS ...
Modeling and Estimation of FPN Components in CMOS Image Sensors
CMOS image sensor fixed pattern noise nonuniformity image sensor characterization
2015/8/14
Fixed pattern noise (FPN) for a CCD sensor is modeled as a sample of a spatial white noise process. This model is,however, not adequate for characterizing FPN in CMOS sensors, since the readout circui...
Single Pixel Test Structures for Characterization and Comparative Analysis of CMOS Image Sensors
Single Pixel Test Structures Comparative Analysis CMOS Image Sensors
2015/8/14
Single Pixel Test Structures for Characterization and Comparative Analysis of CMOS Image Sensors.
Test Structures for Characterization and Comparative Analysis of CMOS Image Sensors
MOS imaging APS quantum efficiency dark current spectral response
2015/8/14
A set of test structures designed to characterize and compare the performance of CMOS passive and active pixel image sensors is presented. The test structures are designed so that they can be rapidly ...