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Investigation of the topography of magnetron-deposited Cu/Ni multilayers by X-ray reflectometry and atomic force microscopy
multilayers Cu/Ni X-ray reflectometry (XRR)
2011/5/11
This paper presents the results of research of Cu/Ni multilayers magnetron-deposited on an Si (100) substrate. The thickness of Cu sublayers was identical in all multilayers and equalled 2 nm. The th...
An impact of the state and type of surface layer on magnetic properties of Cu/Ni and Ni/Cu multilayers
multilayer systems antiferromagnetic coupling
2011/5/11
This paper presents the results of investigation of magnetic properties in Cu/Ni multilayer systems. Based on the investigation of Ni/Cu and Cu/Ni systems with different thickness of magnetic and non-...
Spectroscopic studies of Er-doped Si-rich silicon oxide/SiO2 multilayers
reactive magnetron sputtering
2011/5/3
The effects of Si nanocluster (Si-nc) size and of the distance between Si-nc and Er ion on the photoluminescence of the Er3+ ions have been investigated by means of appropriate multilayer configuratio...